Journal Article

·2007

Abnormal frequency dispersion of the admittance associated with a chromium/plasma deposited a-SiNx:H/p-Si structure

Orhan Özdemi̇r YTU , İsmail Atılgan , Bayram Katırcıoğlu

Journal of Non-Crystalline Solids

No open-access abstract is available for this article. Use the DOI link on the right to read the full text.

Keywords

Capacitance Materials science Admittance Activation energy Condensed matter physics Biasing Conductivity Dispersion (optics) Substrate (aquarium) Diffusion capacitance Low frequency Silicon Analytical Chemistry (journal) Optoelectronics Voltage Chemistry Electrical engineering Electrical impedance Physics Optics Electrode

Subject Areas

Semiconductor materials and devices ·Electrical and Electronic Engineering ·Physical Sciences
Semiconductor materials and interfaces ·Atomic and Molecular Physics, and Optics ·Physical Sciences
Silicon Nanostructures and Photoluminescence ·Materials Chemistry ·Physical Sciences

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