Journal Article

·2015

Adaptation of admittance analysis to extract interface traps of a-Si:H/c-Si heterojunctions

Uğur Deneb Menda YTU , Orhan Özdemi̇r YTU

Materials Science in Semiconductor Processing

No open-access abstract is available for this article. Use the DOI link on the right to read the full text.

Keywords

Materials science Heterojunction Admittance Conductance Capacitance Oxide Semiconductor Analytical Chemistry (journal) Optoelectronics Silicon Voltage Metal Molecular physics Condensed matter physics Physical chemistry Physics Chemistry Electrode Metallurgy

Subject Areas

Thin-Film Transistor Technologies ·Electrical and Electronic Engineering ·Physical Sciences
Silicon and Solar Cell Technologies ·Electrical and Electronic Engineering ·Physical Sciences
Semiconductor materials and interfaces ·Atomic and Molecular Physics, and Optics ·Physical Sciences

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