Journal Article

·2009

Correlation of DC and AC electrical properties of Al/p-Si structure by I–V–T and C(G/ω)–V–T measurements

Orhan Özdemi̇r YTU , Beyhan Tatar YTU , Deneb Yılmazer YTU , Pınar Gökdemir YTU , Kubilay Kutlu YTU

Materials Science in Semiconductor Processing

No open-access abstract is available for this article. Use the DOI link on the right to read the full text.

Keywords

Materials science Condensed matter physics Electrical resistivity and conductivity Crystallography Electrical engineering Physics Chemistry Engineering

Subject Areas

Semiconductor materials and interfaces ·Atomic and Molecular Physics, and Optics ·Physical Sciences
Semiconductor materials and devices ·Electrical and Electronic Engineering ·Physical Sciences
Silicon and Solar Cell Technologies ·Electrical and Electronic Engineering ·Physical Sciences

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