Book Chapter

·2015

I–V Characterization of the Irradiated ZnO:Al Thin Film on P-Si Wafers By Reactor Neutrons

Emrah Gunaydın , Utku Canci Matur , Nilgün Baydoğan , Atíye Tuğrul , Hüseyin Çi̇menoǧlu , S. Serkis Yesilkaya YTU

Springer proceedings in energy

No open-access abstract is available for this article. Use the DOI link on the right to read the full text.

Keywords

Materials science Irradiation Wafer Thin film Neutron Heterojunction Doping Optoelectronics Radiochemistry Nuclear chemistry Analytical Chemistry (journal) Nanotechnology Chemistry Nuclear physics

Subject Areas

Silicon and Solar Cell Technologies ·Electrical and Electronic Engineering ·Physical Sciences
Semiconductor materials and interfaces ·Atomic and Molecular Physics, and Optics ·Physical Sciences
Semiconductor materials and devices ·Electrical and Electronic Engineering ·Physical Sciences

OpenAlex SDG Match

SDGs auto-classified by OpenAlex (score ≥ 0.4 shown).

Affordable and clean energy 83%

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