Journal Article

·2017

Characterization of metal (Ag,Au)/phthalocyanine thin film/semiconductor structures by impedance spectroscopy technique

Çiğdem Oruç YTU , Arden Erkol YTU , Ahmet Altındal YTU

Thin Solid Films

No open-access abstract is available for this article. Use the DOI link on the right to read the full text.

Keywords

Dielectric spectroscopy Electrical impedance Materials science Semiconductor Spectroscopy Reverse bias Metal Dielectric Equivalent circuit Electrode Analytical Chemistry (journal) Grain boundary Phthalocyanine Thin film Optoelectronics Chemistry Nanotechnology Voltage Electrical engineering Composite material Physical chemistry Microstructure Metallurgy Diode

Subject Areas

Molecular Junctions and Nanostructures ·Electrical and Electronic Engineering ·Physical Sciences
Conducting polymers and applications ·Polymers and Plastics ·Physical Sciences
Organic Electronics and Photovoltaics ·Electrical and Electronic Engineering ·Physical Sciences

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