Journal Article

·2015

Optical characterization of spin-coated cobalt porphyrazine thin films: effect of annealing temperature

Kenan Koç YTU , Bahadır Keskin YTU , Cenk Denktaş YTU

Philosophical Magazine Letters

Abstract

Cobalt porphyrazine thin films were prepared by the spin-coating technique. The coated substrates were annealed at different temperatures (373, 423 and 523 K). The optical properties of the films were investigated by measuring the transmittance and reflectance spectra. The refractive index, extinction coefficient, optical band gap, dielectric constant values and thickness of the films were determined. Results showed that the refractive index, the extinction coefficient and the dielectric constants increased on annealing the films at 373 K in comparison with films annealed at other temperatures. On the other hand, the values of the band gap energy and thickness of the annealed film at 373 K were found to be the lowest in comparison with films annealed at different temperatures.

Keywords

Porphyrazine Molar absorptivity Refractive index Annealing (glass) Materials science Dielectric Spin coating Thin film Transmittance Band gap Analytical Chemistry (journal) Cobalt Attenuation coefficient Optics Composite material Chemistry Optoelectronics Nanotechnology Metallurgy Polymer chemistry

Subject Areas

Porphyrin and Phthalocyanine Chemistry ·Materials Chemistry ·Physical Sciences
Thin-Film Transistor Technologies ·Electrical and Electronic Engineering ·Physical Sciences
Transition Metal Oxide Nanomaterials ·Polymers and Plastics ·Physical Sciences

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